|
|
Flat Panel Displays
The critical measurement needs of today's high performance LCD and OLED based displays are well served by Keithley's low current, high precision source and measurement instruments. Keithley incorporates these instruments into standard and customized test systems for FPD researchers and manufacturers striving to develop new materials, optimize production processes, increase yields, and improve the reliability of new display devices. The measurement performance of each Keithley system is tailored to a specific display device technology, such as active or passive matrix LCD, amorphous or low-temperature polysilicon TFTs, polymer and small molecule PLEDs and OLEDs, as well as other emerging technologies.
-
Device Characterization
- Focus Solutions
-
Amorphous, LTPS Thin Film Transistors - I-V, C-V measurements
-
OLED Materials Research - Wide dynamic range, high testing accuracy, fast measurements
-
Storage element capacitance, FET gate charge,gate leakage current, TFT breakdown voltage
-
Functional Test
-
Documents
- White paper
-
- Focus Solutions
-
LCD and Passive OLED Driver IC Test - Source V, measure I; Source I, measure V
-
OLED Active Matrix TFT and Pixel Array Test - LTPS Driver IC IDDQ Current Testing
-
OLED Passive Matrix Array Test - Row/Column shorts and opens, ITO resistivity
-
Materials Research
-
Documents
- White paper
-
- Focus Solutions
-
Organic Materials - Leakage current, reverse breakdown voltage, charge characterization
-
Semiconductors - Resistivity measurements
-
Semiconductors - Stress test for reliability
-
Silicon Semiconductors - Gate Capacitance (charge storage)
-
Process Monitoring (TEG)
-
Products
-
Documents
- White paper
-
- Focus Solutions
-
End-of-line LTPS TFT/Driver acceptance - Transistors (Vt), diodes, capacitors, resistors, gate delay
-
Gate/poly - MOSCAP GOI, ECD, Vt
-
New Technologies - Low Temperature Poly-Silicon AM- LCD/OLED (TEG)
-
Reliability/Lifetime/Burn-In
-
Documents
- White paper
-
- Focus Solutions
-
Accelerated Stress Testing (AST) - Source power, monitor temperature, measure multiple DUTs
-
Lifetime - Temperature and humidity measurement, distributed/remote communication, long life
-
Quality Assurance Testing (QAT)
|