Available on demand

This web-based seminar helps you to make DC parametric measurements with greater accuracy, and avoid common pitfalls.
In this seminar, you'll learn how to:

• Measure resistance without parasitic voltage drops in the cables and probe contacts
• Calculate metal line width
• Minimize parasitic effects in the measurement of transistor parameters
• Avoid common measurement errors such as joule heating and dielectric absorption

This one-hour program is designed as an introductory course in parametric testing and covers the most basic measurement techniques.

The seminar is narrated by Tim Turner, an engineer with over 25 years of experience in semiconductor parametric measurements. Turner has lectured for the extension centers of UCLA and UC Berkeley and is a noted designer of parametric and reliability test structures.