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S400UX User Training Classs

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Who Should Attend:

Test engineers and test programmers whose job is to create and/or maintain parametric test programs for the purpose of gathering parametric test data.

Overview:

The S400UX User Training Class has been designed to teach detailed information on how to use the S400 series Parametric Tester. During the many hands-on sessions, the student uses the Keithley tools to develop test programs for parametric devices within the Keithley Test Environment (version 5.1.x).

Prerequisites:

  • Good working knowledge of the UNIX operating systems and its commands. Understanding of the file systems (directories) and how to edit files using any standard UNIX editor. This class uses the texteditor.
  • Basic understanding of networking and how to use the network.
  • Understanding of the concept of parametric test, why parametric tests are performed, and basic testing methodologies.
  • Good understanding of the C Programming language. This should include the concept of passing arguments between functions and the concept of pointers.

 
What You’ll Learn:

  • After attending this course, users should be able to:
  • The Keithley tools and testing environment.
  • Detailed knowledge on how to control the S400 instruments.
  • How to design, build and execute Parametric test plans for the purpose of extracting parametric test data using the Keithley tools.
  • The format of the parametric test data and how to generate a Lot Summary Report.
  • How to extend the testing environment by creating User Defined Test Modules.
  • This class does not teach The UNIX Operation system or UNIX system administration, the C programming language, parametric testing methodologies, or S400 Hardware maintenance issues.

 
Course Benefits:

  • Reduce test time by utilizing different operating modes of the system.
  • Increase productivity by learning how to optimize instrument setup for your application.
  • Get projects done faster by extending the testing environment.  
  • Avoid measurement errors by learning potential pitfalls and proper measurement techniques.


Course Outline:

  • Overview of the Keithley Test Environment (KTE).
  • General overview of the S400 Hardware system.
  • Initial discussion on how to control the S400 instruments. This includes how to control the instruments using the Linear Parametric Test (LPT) routines. 
  • How to create specific User Defined Modules using Keithley User Library tool (kult).
  • Defining the wafer layout, including site and sub-site definitions, and wafer level definitions using the Wafer Description Utility (wdu).
  • Building a test program using Keithley Interactive Test Tool (kitt), Probe Card file, Global Data file, and Keithley Test Plan Manager (ktpm).
  • Defining the test parameters grading limits using the Limits File Editor (lfe).
  • Executing cassette plans to generate Lot test data.
  • Overview on usage of the User Access Points (UAP) and the Global Data Pool.
  • Using lot test data and Keithley Summary Utility (ksu) to create a Lot Summary Report. A discussion follows on the various Lot Summary Report output formats.
  • Discussion of the Operator’s interfaces and executing test plans
  • Overview on KTE Version Control and Recipe Manager.







page updated: 2006-12-11