Keithley News Releases
Keithley News Releases
Cleveland, Ohio, February 18, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.
Cleveland, Ohio, 18 February 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Phase Change Memory: Fundamentals and Measurement Techniques” on Thursday, February 25, 2010.
Cleveland, Ohio, February 3, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley’s System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.
Cleveland, Ohio, February 1, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced re-sults for its fiscal 2010 first quarter ended December 31, 2009.
Cleveland, Ohio, 19 January 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps for On-Wafer Probing” on Thursday, January 28, 2010.
Cleveland, Ohio, January 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced that it will restore employee compensation to full pay effective January 1, 2010.
Cleveland, Ohio, November 2009 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced that it has signed a definitive agreement with Agilent Technologies, Inc. (“Agilent”) to sell substantially all of its RF product line to Agilent.
Cleveland, Ohio, November 17, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced results for its fourth quarter and year ended September 30, 2009.
Cleveland, Ohio, 11 November 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is hosting a free online seminar in which the company will explore the basics of electrical measurements from nA to fA.
Cleveland, Ohio, 26 October 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will host a free 45-minute online seminar entitled “Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals”.
Cleveland, Ohio, August 27, 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation.
Cleveland, Ohio, July 2009 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 third quarter ended June 30, 2009.
Cleveland, Ohio, July 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices.
Cleveland, Ohio, July 6, 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6×16 High Speed, Reed Relay, Matrix Card.
Cleveland, Ohio, June 22, 2009
Cleveland, Ohio, May 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Semiconductor Capacitance-Voltage (C-V) Fundamentals,” which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). This one-hour seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. To register for this event, visit http://tiny.cc/Oj6Zm.
Cleveland, Ohio, May 11, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing.
Cleveland, Ohio, April 29, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 second quarter ended March 31, 2009.
Cleveland, Ohio, April 2, 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, April 1, 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, April 2, 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, April 1, 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, March 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, March 20, 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, March 20, 2009 * * * Keithley Instruments, Inc.
Cleveland, Ohio, March 19, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
Cleveland, Ohio, March 16, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is offering a 20% discount off the list price on a range of world-class Test & Measurement instruments to its European customers. The offer is available for a limited period of time, starting with immediate effect and ending on May 31, 2009.
Cleveland, Ohio, February 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 first quarter ended December 31, 2008.
Cleveland, Ohio, February 12, 2009
Cleveland, Ohio, February 2009
Cleveland, Ohio, November 26, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in emerging measurement solutions, announces ACS Basic Edition, characterization and curve tracer software for component test applications
Cleveland, Ohio, October 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 3390 50MHz Arbitrary Waveform/Function Generator, featuring the highest waveform resolution and best price-to-performance value in its class.
Cleveland, Ohio, September 23, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces its Series 2600A System SourceMeter® Instrument family.
Cleveland, Ohio, August 21, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, is extending its lead in RF MIMO (multiple-input, multiple-output) test with the industry’s first measurement-grade 8x8 MIMO system.
Cleveland, Ohio, July 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems: Demystifying WLAN and WiMAX Testing, a new guide to wireless and RF testing.
Cleveland, Ohio, July 24 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 third quarter ended June 30, 2008.
Cleveland, Ohio, July 15, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced an expansion of its Series 3700 System Switch/Multimeter and Plug-in Card Family with the addition of two new plug-in cards, the Model 3724 Dual 1X30 Solid State FET Relay Multiplexer Card and the Model 3750 Multifunction I/O Card.
Cleveland, Ohio, July 15, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company’s award-winning Model 4200-SCS Semiconductor Characterization System.
Cleveland, Ohio and Acton, Massachusetts, June 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a joint effort with Azimuth Systems, a leading provider of wireless broadband test equipment and channel emulators for WiMAX, 4G, and Wi-Fi (Acton, MA).
Cleveland, Ohio, June 3, 2008 * * * The Institute of Electrical and Electronics Engineers (IEEE) has announced that Robert G. Fulks is the recipient of the 2008 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.
Cleveland, Ohio, May 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of the Precision Sourcing and Measurement Resource Guide.
Cleveland, Ohio, May 8, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of the Semiconductor Device Test Applications Guide.
Cleveland, Ohio, Mai, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released the sixth edition of its Switching Handbook: A Guide to Signal Switching in Automated Test Systems.
Cleveland, Ohio, April 29, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications.
Cleveland, Ohio, April 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 second quarter ended March 31, 2008.
Cleveland, Ohio, February 11, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a partnership with Stratosphere Solutions, Inc. (Sunnyvale, CA), a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers.
Cleveland, Ohio, January 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of its 2008 Test and Measurement Product Guide.
Cleveland, Ohio, January 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 first quarter ended December 31, 2007.
Cleveland, Ohio, January 10, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of ACS (Automated Characterization Suite) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level.
Cleveland, Ohio, December 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that it has become a member of the WiMAX Forum®.
Cleveland, Ohio, November 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fourth quarter and year that ended September 30, 2007.
Cleveland, Ohio, SEMICON Europa, Stuttgart, October 9, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a new C-V measurement instrument for its powerful Model 4200-SCS Semiconductor Characterization System.
Cleveland, Ohio, Germering, Germany, October 1, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that the American Association for Laboratory Accreditation (A2LA) has accredited Keithley’s German service center to ISO/IEC 17025:2005, the single most important metrology standard for test and measurement products.
Cleveland, Ohio, September 20, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced a new partnership with The California NanoSystems Institute at UCLA.
Cleveland, Ohio, September 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces two new additions to its Series 2600 SourceMeter® Instruments to create the industry’s most advanced and cost effective solution for semiconductor parametric analysis and testing.
Cleveland, Ohio, September 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of the Series 3700 System Switch/Multimeter and Plug-in Card Family, Keithley’s next-generation platform of switching and integrated digital multimeter (DMM) test solutions.
Cleveland, Ohio - July 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2007 third quarter ended June 30, 2007.
Cleveland, Ohio, July 19, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a group of enhancements for its S600 Series Parametric Test Systems.
Cleveland, Ohio, July 18, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has qualified FormFactor, Inc., (Nasdaq:FORM), Livermore, California, to manufacture high performance parametric test probe cards for Keithley’s semiconductor parametric testers.
Cleveland, Ohio , Grenoble, France, July 17, 2007 *** Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has entered into a Joint Development Partnership (JDP) surrounding semiconductor device material testing technology with CEA Leti, one of the world’s most sophisticated semiconductor development laboratories.
Cleveland, Ohio - July 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has received the Texas Instruments (TI) 2006 Supplier Excellence Award.
Cleveland, Ohio - April 2007 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced that sales levels for the second quarter of fiscal 2007, which ended March 31, 2007, fell short of the guidance range that was previously provided.
Cleveland, Ohio - April 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its Nanotechnology Measurement Handbook, a 124-page guide to electrical measurements for nanoscience applications.
Cleveland, Ohio - April 12, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level.
Cleveland, Ohio - March 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published "Understanding New Developments in Data Acquisition, Measurement, and Control."
Cleveland, Ohio - March 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the newest release of hardware and software advances for its award-winning Model 4200-SCS Semiconductor Characterization System, representing the next step in pulse test offerings for the Model 4200-SCS.
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its 2007 Test and Measurement Product Catalogue.
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released the Simplified Test Toolkit, an interactive tutorial CD that helps test engineers overcome tough measurement challenges.
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook.
Cleveland, Ohio - January 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has been recognized for outstanding customer satisfaction by VLSI Research Inc, a global leader in providing independent customer evaluations of semiconductor equipment suppliers.
Cleveland, Ohio - January 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2007 first quarter ended December 31, 2006.
Cleveland, Ohio - December 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of KTE V5.2, Keithley’s Interactive Test Environment software for the Series S600 Parametric Test System.
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board.
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of KTE Interactive V6.1, an updated version of its powerful KTEI (Keithley Test Environment Interactive) measurement software for its Model 4200-SCS Semiconductor Characterization System.
Cleveland, Ohio - November 14, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments.
Cleveland, Ohio – November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces it has partnered with Mesatronic Group (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications.
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 2810 RF Vector Signal Analyzer, optimized for automated testing of wireless devices and transmitter circuits in production test environments, as well as in new product and device research and development.
Cleveland, Ohio - September 2006 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, announces that its Metrology Services Group is now accredited to ISO/IEC 17025:2005,the single most important metrology standard for test and measurement, by the A2LA (American Association for Laboratory Accreditation).
Cleveland, Ohio - January 25, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2006 first quarter ended December 31, 2005.
Cleveland, Ohio – January 17, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, is celebrating this year its 60th year of innovation.
Cleveland, Ohio – January 5, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its 2006 Test and Measurement Product Catalog.
Cleveland, Ohio - November 4, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fourth quarter and year that ended September 30, 2005.
Cleveland, Ohio - October 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced significant expansions of its business presence in southeast Asia with an office expansion in Singapore and the opening of two new offices in Malaysia.
Cleveland, Ohio, - July 2005 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, has published a semiconductor test reference handbook titled Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF-From Modeling to Manufacturing.
Cleveland, Ohio - April 11, 2005 - Keithley Instruments, Inc. (NYSE:KEI), announces the S510 Semiconductor Reliability Test System, a high channel count, turnkey solution for use in reliability testing and lifetime modeling of the world’s most advanced ULSI CMOS processes at the 65nm node and beyond.
Cleveland, Ohio – March 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Series KUSB-3100 USB-based data acquisition (DAQ) measurement solutions.
Cleveland, OH - March 14, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, today announced it has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Hynix Semiconductor, Inc., a leading Korean semiconductor manufacturer and one of the world's largest DRAM (Dynamic Random Access Memory) producers.
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces its third generation on-wafer RF measurement capability for semiconductor parametric production process control.
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Series 2600 System SourceMeter® Instruments, a new platform that significantly lowers the cost of test for a wide range of electronic component producers, including silicon and compound semiconductor manufacturers.
Cleveland, Ohio, February 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced that AMD (NYSE: AMD) has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany.
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2005 first quarter that ended December 31, 2004.
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 7002-HD high-density two-slot switching mainframe and cards, offering instrument grade switching at a price up to 40% less than comparable platforms.
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released an interactive, tutorial CD on reliability testing for semiconductor test engineers.
Cleveland, Ohio, October 2004 Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, has published an updated version of its popular reference book titled, "Low Level Measurements Handbook: Precision DC Current, Voltage, and Resistance Measurements."
Cleveland, Ohio, October 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KUSB-488 USB-to-GPIB Interface Adapter. The Model KUSB-488 transforms any computer with a USB port into a full-function, IEEE 488.2 controller that can control up to 14 programmable GPIB instruments.
Cleveland, Ohio, September 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced it has received a multi-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF Parametric Test Systems. The multi-million dollar order represents tools for production process control of both 200mm and 300mm wafers.
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, a leader in solutions for emerging measurement needs, announced results for its fiscal 2004 third quarter that ended June 30, 2004.
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has developed a packaged, ready-to-run parametric test system with unrivaled cost-per-pin and total price/performance ratio.
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced its Model 2182A nanovoltmeter, which is optimized for making low noise measurements in research, metrology, nanotechnology, superconductivity, and other low voltage/resistance applications.
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, introduced its Model 6221 AC and DC Current Source and Model 6220 DC Current Source.
Cleveland, Ohio, May 2004 - Keithley Instruments, Inc. (NYSE: KEI) has announced availability of its Four Step Error Checker Poster that offers guidance to engineers and scientists for avoiding common low-level measurement errors.
Cleveland, Ohio, March 25, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced that it is releasing a tutorial CD containing a collection of its on-line seminars on measurement methods.
Albany, NY, February 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that it is partnering with the Albany NanoTech Center at the University at Albany - State University of New York (SUNY) to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies.
Cleveland, Ohio, January 2004 - Keithley Instruments, Inc. (NYSE: KEI) today announced the newest model in its S600 Series family, the S680DC/RF Parametric Test System.