Keithley News Releases

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis
Cleveland, Ohio, February 18, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

Free Keithley Online Seminar Explores Phase Change Memory Measurement Techniques
Cleveland, Ohio, 18 February 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Phase Change Memory: Fundamentals and Measurement Techniques” on Thursday, February 25, 2010.

LeCROY Chooses Keithley RF/Microwave Switch for its Superspeed USB 3.0 Test Suite
Cleveland, Ohio, February 3, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley’s System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.

Keithley Instruments Reports Profitable Results For Fiscal 2010 First Quarter
Cleveland, Ohio, February 1, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced re-sults for its fiscal 2010 first quarter ended December 31, 2009.

Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Cleveland, Ohio, 19 January 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps for On-Wafer Probing” on Thursday, January 28, 2010.

Keithley Instruments Restores Employee Compensation; Updates First Quarter Fiscal 2010 Guidance
Cleveland, Ohio, January 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced that it will restore employee compensation to full pay effective January 1, 2010.

Keithley Instruments Announces Sale of RF Product Line
Cleveland, Ohio, November 2009 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced that it has signed a definitive agreement with Agilent Technologies, Inc. (“Agilent”) to sell substantially all of its RF product line to Agilent.

Keithley Instruments Reports Fiscal 2009 Results
Cleveland, Ohio, November 17, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced results for its fourth quarter and year ended September 30, 2009.

Technical Web Seminar from Keithley Teaches the Basics of Low Current Electrical Measurements
Cleveland, Ohio, 11 November 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is hosting a free online seminar in which the company will explore the basics of electrical measurements from nA to fA.

Keithley Explores the Basics of Semiconductor C-V Testing in Free Online Seminar
Cleveland, Ohio, 26 October 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will host a free 45-minute online seminar entitled “Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals”.

Keithley Expands Range of DC Source-Measure Instruments Compatible with ACS Basic Edition Software
Cleveland, Ohio, August 27, 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation.

Keithley Instruments Reports Fiscal 2009 Third Quarter Results
Cleveland, Ohio, July 2009 – Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 third quarter ended June 30, 2009.

New Keithley Microsite Offers Access to Informative Photovoltaic Measurements Seminar, Online Solar Cell Demo
Cleveland, Ohio, July 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices.

New High Speed, Long Life 6×16 Matrix Card Expands Keithley’s Series 3700 System Switch/Multimeter Family
Cleveland, Ohio, July 6, 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6×16 High Speed, Reed Relay, Matrix Card.

Keithley Adds Free Graphing Toolkit to Series 3700 System Switch/Multimeter Firmware for an “Early Look” at Acquired Data
Cleveland, Ohio, June 22, 2009

Free Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing
Cleveland, Ohio, May 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Semiconductor Capacitance-Voltage (C-V) Fundamentals,” which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). This one-hour seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. To register for this event, visit http://tiny.cc/Oj6Zm.

Free Keithley Web-Based Technical Seminar Explores Electrical Measurements of Photovoltaic/Solar Cell Devices
Cleveland, Ohio, May 11, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing.

Keithley Instruments Reports Results for Fiscal 2009 Second Quarter
Cleveland, Ohio, April 29, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 second quarter ended March 31, 2009.

Keithley Seminar to Visit Two Benelux Locations
Cleveland, Ohio, April 2, 2009 * * * Keithley Instruments, Inc.

Keithley Seminar Tour Takes Place in 22 European Cities
Cleveland, Ohio, April 1, 2009 * * * Keithley Instruments, Inc.

Keithley European Seminar Tour to Visit Two Swedish Locations in May
Cleveland, Ohio, April 2, 2009 * * * Keithley Instruments, Inc.

Keithley European Seminar Tour to Visit Four UK Locations in May
Cleveland, Ohio, April 1, 2009 * * * Keithley Instruments, Inc.

Keithley White Paper Describes Semiconductor Characterization and Parametric Test Challenges
Cleveland, Ohio, March 2009 * * * Keithley Instruments, Inc.

Only Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment now Available from Keithley
Cleveland, Ohio, March 20, 2009 * * * Keithley Instruments, Inc.

Keithley Upgrades Model 4200-SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support
Cleveland, Ohio, March 20, 2009 * * * Keithley Instruments, Inc.

Keithley Webcast Seminar Explores how to Avoid Parallel Test Implementation Pitfalls
Cleveland, Ohio, March 19, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Keithley Offers Attractive Price Specials for Test & Measurement Instruments
Cleveland, Ohio, March 16, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is offering a 20% discount off the list price on a range of world-class Test & Measurement instruments to its European customers. The offer is available for a limited period of time, starting with immediate effect and ending on May 31, 2009.

Keithley Instruments Reports Results for Fiscal 2009 First Quarter
Cleveland, Ohio, February 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 first quarter ended December 31, 2008.

Free Keithley Web-Based Seminar Explores Fundamentals of Hall Effect Measurements
Cleveland, Ohio, February 12, 2009

Keithley Releases New 2009 Test And Measurement Product Guide
Cleveland, Ohio, February 2009

Keithley’s Cost Effective Component Test Solution Combines Dramatic Ease of Use with Powerful Curve Tracer Capabilities
Cleveland, Ohio, November 26, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in emerging measurement solutions, announces ACS Basic Edition, characterization and curve tracer software for component test applications

Keithley Introduces Flexible, High Performance 50MHz Arbitrary Waveform/Function Generator
Cleveland, Ohio, October 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 3390 50MHz Arbitrary Waveform/Function Generator, featuring the highest waveform resolution and best price-to-performance value in its class.

Keithley Launches New SourceMeter® Instrument Platform that Provides Industry’s Fastest, Easiest I-V Characterization
Cleveland, Ohio, September 23, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces its Series 2600A System SourceMeter® Instrument family.

Keithley Expands MIMO RF Measurement Capabilities with Industry’s First 8x8 MIMO Test System
Cleveland, Ohio, August 21, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, is extending its lead in RF MIMO (multiple-input, multiple-output) test with the industry’s first measurement-grade 8x8 MIMO system.

Keithley Releases Guide to Wireless and RF Testing
Cleveland, Ohio, July 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems: Demystifying WLAN and WiMAX Testing, a new guide to wireless and RF testing.

Keithley Instruments Reports 22 Percent Sales Growth for Fiscal 2008 Third Quarter
Cleveland, Ohio, July 24 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 third quarter ended June 30, 2008.

Keithley Expands 3700 System Switch/Multimeter Line with New Plug-In Cards
Cleveland, Ohio, July 15, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced an expansion of its Series 3700 System Switch/Multimeter and Plug-in Card Family with the addition of two new plug-in cards, the Model 3724 Dual 1X30 Solid State FET Relay Multiplexer Card and the Model 3750 Multifunction I/O Card.

KTEI V7.1 Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C V, I-V, and Pulsed I-V Characterization
Cleveland, Ohio, July 15, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company’s award-winning Model 4200-SCS Semiconductor Characterization System.

Keithley and Azimuth Systems Announce Collaboration to Create LTE, WiMAX RF Testing Solutions
Cleveland, Ohio and Acton, Massachusetts, June 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a joint effort with Azimuth Systems, a leading provider of wireless broadband test equipment and channel emulators for WiMAX, 4G, and Wi-Fi (Acton, MA).

Fulks Receives 2008 IEEE Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement
Cleveland, Ohio, June 3, 2008 * * * The Institute of Electrical and Electronics Engineers (IEEE) has announced that Robert G. Fulks is the recipient of the 2008 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.

Keithley Creates Precision Sourcing and Measurement Resource Guide CD
Cleveland, Ohio, May 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of the Precision Sourcing and Measurement Resource Guide.

Keithley Releases CD of Semiconductor Device Test Applications
Cleveland, Ohio, May 8, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of the Semiconductor Device Test Applications Guide.

Keithley Releases New Edition of Switching Handbook
Cleveland, Ohio, Mai, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released the sixth edition of its Switching Handbook: A Guide to Signal Switching in Automated Test Systems.

Automated Characterization Suite (ACS) Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster
Cleveland, Ohio, April 29, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications.

Keithley Instruments Reports 21 Percent Sales Growth for Fiscal 2008 Second Quarter
Cleveland, Ohio, April 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 second quarter ended March 31, 2008.

Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
Cleveland, Ohio, February 11, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a partnership with Stratosphere Solutions, Inc. (Sunnyvale, CA), a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers.

Keithley Releases New 2008 Test and Measurement Product Guide
Cleveland, Ohio, January 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of its 2008 Test and Measurement Product Guide.

Keithley Instruments Reports Results for Fiscal 2008 First Quarter
Cleveland, Ohio, January 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 first quarter ended December 31, 2007.

Keithley ACS Version 3.2 Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput
Cleveland, Ohio, January 10, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of ACS (Automated Characterization Suite) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level.

Keithley Joins WiMAX Forum®
Cleveland, Ohio, December 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that it has become a member of the WiMAX Forum®.

Keithley Instruments Reports Fiscal 2007 Results
Cleveland, Ohio, November 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fourth quarter and year that ended September 30, 2007.

Keithley makes C-V/I-V/Pulse Testing Faster, Simpler, and More Economical with New Integrated C-V Module and Software in Market-Leading 4200-SCS
Cleveland, Ohio, SEMICON Europa, Stuttgart, October 9, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a new C-V measurement instrument for its powerful Model 4200-SCS Semiconductor Characterization System.

Keithley’s German Service Center Joins List of ISO 17025 Accredited Laboratories
Cleveland, Ohio, Germering, Germany, October 1, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that the American Association for Laboratory Accreditation (A2LA) has accredited Keithley’s German service center to ISO/IEC 17025:2005, the single most important metrology standard for test and measurement products.

Keithley and CNSI Announce Nanotechnology Measurement Partnership
Cleveland, Ohio, September 20, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced a new partnership with The California NanoSystems Institute at UCLA.

Keithley Adds Low Current Capability to SourceMeter® Line for Fast, Compact, and Economical Parametric Testing
Cleveland, Ohio, September 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces two new additions to its Series 2600 SourceMeter® Instruments to create the industry’s most advanced and cost effective solution for semiconductor parametric analysis and testing.

New Keithley System Switch Platform Offers High Throughput Signal Switching, LXI Class B, and Optional High-Performance Integrated DMM
Cleveland, Ohio, September 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of the Series 3700 System Switch/Multimeter and Plug-in Card Family, Keithley’s next-generation platform of switching and integrated digital multimeter (DMM) test solutions.

Keithley Instruments Reports Results for Fiscal 2007 Third Quarter
Cleveland, Ohio - July 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2007 third quarter ended June 30, 2007.

Keithley Introduces Linux-Based Parametric Test Systems
Cleveland, Ohio, July 19, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a group of enhancements for its S600 Series Parametric Test Systems.

Keithley Announces Advanced Parametric Probe Card Availability
Cleveland, Ohio, July 18, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has qualified FormFactor, Inc., (Nasdaq:FORM), Livermore, California, to manufacture high performance parametric test probe cards for Keithley’s semiconductor parametric testers.

Keithley Announces Joint Development Partnership with France’s CEA Leti Laboratory to Pursue Advanced Nanotechnology and Semiconductor Materials Research
Cleveland, Ohio , Grenoble, France, July 17, 2007 *** Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has entered into a Joint Development Partnership (JDP) surrounding semiconductor device material testing technology with CEA Leti, one of the world’s most sophisticated semiconductor development laboratories.

Keithley Instruments Recognized for Excellence by Texas Instruments
Cleveland, Ohio - July 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has received the Texas Instruments (TI) 2006 Supplier Excellence Award.

Keithley Instruments Expects Financial Results for its Second Quarter of Fiscal 2007 to be Below Guidance
Cleveland, Ohio - April 2007 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced that sales levels for the second quarter of fiscal 2007, which ended March 31, 2007, fell short of the guidance range that was previously provided.

Keithley Publishes Handbook on Nanotechnology Measurement
Cleveland, Ohio - April 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its Nanotechnology Measurement Handbook, a 124-page guide to electrical measurements for nanoscience applications.

Keithley Launches Integrated Test Systems for Faster and Easier Semiconductor Testing
Cleveland, Ohio - April 12, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level.

Keithley Publishes New Data Acquisition, Measurement, and Control Handbook
Cleveland, Ohio - March 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published "Understanding New Developments in Data Acquisition, Measurement, and Control."

Keithley Introduces New Enhanced Pulse and Pulse I-V Capabilities for Advanced Semiconductor Device Testing
Cleveland, Ohio - March 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the newest release of hardware and software advances for its award-winning Model 4200-SCS Semiconductor Characterization System, representing the next step in pulse test offerings for the Model 4200-SCS.

Keithley Publishes New 2007 Test and Measurement Product Catalogue
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its 2007 Test and Measurement Product Catalogue.

Keithley Introduces Measurement How-To Library on CD
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released the Simplified Test Toolkit, an interactive tutorial CD that helps test engineers overcome tough measurement challenges.

Keithley Introduces Handbook for Parametric Parallel Test
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook.

Keithley Recognized for Outstanding Customer Satisfaction in Semiconductor Industry
Cleveland, Ohio - January 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has been recognized for outstanding customer satisfaction by VLSI Research Inc, a global leader in providing independent customer evaluations of semiconductor equipment suppliers.

Keithley Instruments Reports 15 Percent Sales Growth for Fiscal 2007 First Quarter
Cleveland, Ohio - January 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2007 first quarter ended December 31, 2006.

Keithley’s New Parametric Test Software Upgrade Enhances Parallel Test, RF Test, and Ease
Cleveland, Ohio - December 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of KTE V5.2, Keithley’s Interactive Test Environment software for the Series S600 Parametric Test System.

Keithley Introduces New Low-Cost, Full Featured GPIB Interface
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board.

Keithley Introduces New Version of Test Software for Improved Pulse Measurements
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of KTE Interactive V6.1, an updated version of its powerful KTEI (Keithley Test Environment Interactive) measurement software for its Model 4200-SCS Semiconductor Characterization System.

Keithley Introduces PXI Products for Hybrid Test Systems in Production Applications
Cleveland, Ohio - November 14, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments.

Keithley and Mesatronic Enter Agreement to Advance Parametric Wafer Probe Technology For Economical, High Performance, Ultra Low Current and RF Probe Cards
Cleveland, Ohio – November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces it has partnered with Mesatronic Group (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications.

Keithley Introduces Fast, Flexible Vector Signal Analyzer Model 2810
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 2810 RF Vector Signal Analyzer, optimized for automated testing of wireless devices and transmitter circuits in production test environments, as well as in new product and device research and development.

Keithley's Metrology Services Earns Rigorous ISO 17025 Accreditation
Cleveland, Ohio - September 2006 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, announces that its Metrology Services Group is now accredited to ISO/IEC 17025:2005,the single most important metrology standard for test and measurement, by the A2LA (American Association for Laboratory Accreditation).

Keithley Instruments Reports Results for Fiscal 2006 First Quarter
Cleveland, Ohio - January 25, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2006 first quarter ended December 31, 2005.

Keithley Recognizes 60 Year Milestone
Cleveland, Ohio – January 17, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, is celebrating this year its 60th year of innovation.

Keithley Publishes 2006 Test And Measurement Product Catalog
Cleveland, Ohio – January 5, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its 2006 Test and Measurement Product Catalog.

Keithley Instruments Reports Results for Fiscal 2005 Fourth Quarter and Year
Cleveland, Ohio - November 4, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fourth quarter and year that ended September 30, 2005.

Keithley Opens New Offices in Asia to Optimize Local Applications and Customer Support
Cleveland, Ohio - October 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced significant expansions of its business presence in southeast Asia with an office expansion in Singapore and the opening of two new offices in Malaysia.

Keithley Publishes New Semiconductor Test Tutorial Handbook
Cleveland, Ohio, - July 2005 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, has published a semiconductor test reference handbook titled Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF-From Modeling to Manufacturing.

Keithley Introduces New Semiconductor Reliability Test System For 65NM And Beyond
Cleveland, Ohio - April 11, 2005 - Keithley Instruments, Inc. (NYSE:KEI), announces the S510 Semiconductor Reliability Test System, a high channel count, turnkey solution for use in reliability testing and lifetime modeling of the world’s most advanced ULSI CMOS processes at the 65nm node and beyond.

Keithley Introduces Family of USB Data Acquisition Solutions
Cleveland, Ohio – March 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Series KUSB-3100 USB-based data acquisition (DAQ) measurement solutions.

Hynix Awards Keithley Repeat Multi-Million Dollar Order for S680DC/RF Semiconductor Test System for Production Testing of 300mm Wafers
Cleveland, OH - March 14, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, today announced it has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Hynix Semiconductor, Inc., a leading Korean semiconductor manufacturer and one of the world's largest DRAM (Dynamic Random Access Memory) producers.

Keithley Introduces 3RD Generation of On-Wafer RF Measurement Capability
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces its third generation on-wafer RF measurement capability for semiconductor parametric production process control.

Keithley Introduces Industry's Fastest, Smallest, and Most Cost-Effective Source-Measure Units for Multi-Channel Applications
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Series 2600 System SourceMeter® Instruments, a new platform that significantly lowers the cost of test for a wide range of electronic component producers, including silicon and compound semiconductor manufacturers.

Keithley's Model S680 Semiconductor Test System Selected by AMD Fab 36 in Dresden, Germany
Cleveland, Ohio, February 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced that AMD (NYSE: AMD) has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany.

Keithley Instruments Reports 20% Sales Growth and 156% Earnings Growth for Fiscal 2005 First Quarter
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2005 first quarter that ended December 31, 2004.

Keithley Expands Switching Product Line, Offering Industry's Highest Density Half-Rack Switching System
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 7002-HD high-density two-slot switching mainframe and cards, offering instrument grade switching at a price up to 40% less than comparable platforms.

Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released an interactive, tutorial CD on reliability testing for semiconductor test engineers.

Keithley Low Level Measurements Handbook Contains Tutorial Information on How to Make Accurate, Sensitive Measurements
Cleveland, Ohio, October 2004 Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, has published an updated version of its popular reference book titled, "Low Level Measurements Handbook: Precision DC Current, Voltage, and Resistance Measurements."

Keithley Releases USB-to-GPIB Interface Adapter
Cleveland, Ohio, October 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KUSB-488 USB-to-GPIB Interface Adapter. The Model KUSB-488 transforms any computer with a USB port into a full-function, IEEE 488.2 controller that can control up to 14 programmable GPIB instruments.

Keithley Instruments Receives Order for Multiple S680 Parametric Test Systems from Leading Korean Fab
Cleveland, Ohio, September 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced it has received a multi-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF Parametric Test Systems. The multi-million dollar order represents tools for production process control of both 200mm and 300mm wafers.

Keithley Reports Double-Digit Sales and Order Growth for Fiscal 2004 Third Quarter
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, a leader in solutions for emerging measurement needs, announced results for its fiscal 2004 third quarter that ended June 30, 2004.

Keithley Introduces Ready-to-Run 200mm Wafer Test System for 130nm Node and Beyond
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has developed a packaged, ready-to-run parametric test system with unrivaled cost-per-pin and total price/performance ratio.

Keithley Launches Model 2182A Nanovoltmeter for Eliminating Noise in Low Voltage Measurements
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced its Model 2182A nanovoltmeter, which is optimized for making low noise measurements in research, metrology, nanotechnology, superconductivity, and other low voltage/resistance applications.

Keithley Releases Precision DC AND AC/DC Current Sources
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, introduced its Model 6221 AC and DC Current Source and Model 6220 DC Current Source.

Keithley Publishes Four Step Error Checker Poster
Cleveland, Ohio, May 2004 - Keithley Instruments, Inc. (NYSE: KEI) has announced availability of its Four Step Error Checker Poster that offers guidance to engineers and scientists for avoiding common low-level measurement errors.

Keithley provides free Test & Measurement Seminar CD
Cleveland, Ohio, March 25, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced that it is releasing a tutorial CD containing a collection of its on-line seminars on measurement methods.

Keithley Instruments Announces Nanotech Partnership with The SUNY-Albany Nanotech Center
Albany, NY, February 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that it is partnering with the Albany NanoTech Center at the University at Albany - State University of New York (SUNY) to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies.

New System Tests 300mm Wafers in 200mm Test Times
Cleveland, Ohio, January 2004 - Keithley Instruments, Inc. (NYSE: KEI) today announced the newest model in its S600 Series family, the S680DC/RF Parametric Test System.