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Keithley News Releases

Keithley News Releases
Keithley Online Seminar Shows How to Test High Power Devices More Efficiently
Cleveland, Ohio, May 16, 2012 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will webcast a free, online technical seminar titled “Fundamentals of High Power Semiconductor Device Testing” on Thursday, May 24 at 15:00 CEST. To register for this event, visit http://www.keithley.info/high-power-semi-test-basics.

Keithley Expands Measurement Capability of S530 Parametric Test Systems
Cleveland, Ohio, March 29, 2012 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, continues to enhance the capabilities of its S530 Parametric Test Systems, the semiconductor industry’s most cost-effective solution for high speed production parametric test.

Pintelon Receives 2012 IEEE Joseph F. Keithley Award for Innovative System Identification Methods for Measurement Applications
Cleveland, Ohio, March 28, 2012 * * * The IEEE has named Dr. Rik Pintelon as the recipient of the 2012 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. Pintelon is being recognized for the development of innovative system identification methods for measurement applications.

Keithley Introduces High Voltage System SourceMeter® Instrument Optimized for High Power Semiconductor Test
Cleveland, Ohio, March 22, 2012 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 2657A High Power System SourceMeter® instrument. The Model 2657A adds high voltage to the company's Series 2600A System SourceMeter® family of high speed, precision source measurement units.

Free Keithley Web-Based Seminar Explores Source Measurement Instrumentation
Cleveland, Ohio, February 15, 2012 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “What is an SMU Instrument, and How Do You Decide Which One is Right for Your Application?”

Keithley Publishes 2012 Test & Measurement Product Catalog
Cleveland, Ohio, February 2012 * * * Keithley Instruments, Inc., world leader in advanced electrical test instruments and systems, has published its 2012 Test & Measurement Product Catalog.

New Keithley Semiconductor Software Expands Support for Reliability/High Power Device Test
Cleveland, Ohio, 25 January 2012 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has upgraded the capabilities of its Automated Characterization Suite (ACS) Test Environment.

Keithley Online Seminar Teaches Techniques for Making Error-Free Low I and High R Measurements
Cleveland, Ohio, 21 October 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a web-based seminar titled “Techniques for Making Optimal Low Current and High Resistance Measurements” on Tuesday, October 27, 2011 at 15:00 CEST (UTC/GMT: 13:00). To register for this event, visit http://www.keithley.info/lowIhighR.

Keithley Publishes CD on High Performance Source Measurement Solutions
Cleveland, Ohio, 12 October 2011 * * * Keithley Instruments, Inc., Inc., a world leader in advanced electrical test instruments and systems, has published an informative CD entitled, “Configuring Cost-Effective, High Performance Sourcing and Measurement Solutions.” A free copy is available upon request from Keithley at: http://www.keithley.com/promo/pr/092.

KeithleyCare (TradeMark) Repair and Calibration Service Plans Cut Costs, Reduce Downtime, and Protect Instrument Investments
CLEVELAND, OH, October 5, 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced KeithleyCare (TradeMark) Plans to provide owners of Keithley instrumentation with fast, high quality instrument calibration and repair services at a fraction of the cost of “per-event” service.

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C‑V, and Increased Parallel Testing to Semiconductor Parameter Analyzer
Cleveland, Ohio, 29 September 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model 4200-SCS Semiconductor Characterization System.

Keithley Instruments Products to Be Distributed by Metric Industrial Oy in Finland, Baltic States
CLEVELAND, OH, August 30, 2011 * * * Keithley Instruments, Inc., a world lead-er in advanced electrical test instruments and systems, has signed an agreement for the distribution of its products in Finland and the Baltic states (Estonia, Latvia, and Lithuania) with Metric Industrial Oy, a Finnish company specializing in distributing components and test equipment for the industrial automation, fiber optic networks, and electronics industries.

Keithley Publishes Low Voltage, Low Resistance Measurements E-Handbook
Cleveland, Ohio, August 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an electronic handbook titled “Making Precision Low Voltage and Low Resistance Measure-ments.”

Keithley Instruments Signs Distribution Agreement with Nortelco Electronics of Sweden
Germering, Germany, August 18, 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has signed a distribution agreement with Nortelco Electronics to handle sales and support of the company’s products in Sweden.

Keithley Publishes Online Nanotechnology Seminars on CD
Cleveland, Ohio, 20 June 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has assembled a new col-lection of its nanotechnology-focused web tutorials and seminars in a convenient CD format. “Characterizing Nano-Materials and Devices with Precision and Con-fidence” is available free upon request at: http://www.keithley.co.uk/pr/089.

Free Keithley Web-Based Seminar Explores Electrical Characterization of Solar Cells
Cleveland, Ohio, 16 June 2011 * * * Keithley Instruments, Inc., Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Understanding Electrical Characterization of Solar Cells” on Thursday, June 30, 2011.

Keithley Publishes E-Guide About High Performance Source-Measure Solutions
Cleveland, Ohio, 8 June 2011 * * * Keithley Instruments, Inc., world leader in advanced electrical test instruments and systems, has published an informative e-guide titled “Cost-effective, high performance sourcing and measurement solutions.” A free copy is downloadable upon request from Keithley at: http://www.keithley.co.uk/pr/090.

Free Keithley Online Seminar Explains the Complexities of High Power High Brightness LED Test
Cleveland, Ohio, 9 May 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Meeting the Electrical Measurement Demands of High Power High Brightness LEDs” on Thursday, 26 May 2011. To register for this event, visit http://www.keithley.info/HBLEDTest.

Keithley Publishes E-Handbook on Precision Low Current, High Resistance Measurements
Cleveland, Ohio, 27 April 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e handbook titled “Making Precision Low Current and High Resis-tance Measurements.” A free copy can be downloaded from Keithley’s website at http://www.keithley.com/pr/088.

Keithley Introduces System SourceMeter® Instrument Optimized for High Power Semiconductor Test
Cleveland, Ohio, April 4, 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced the Model 2651A High Power System SourceMeter® instrument, the latest addition to the company’s Series 2600A System SourceMeter family.

Keithley Publishes E-Handbook on Nanoscale Electrical Measurements
Cleveland, Ohio, April 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled “Ensuring the Accuracy of Nanoscale Electrical Measurements.” A free copy is downloadable upon request from Keithley at: http://www.keithley.com/pr/087.

Keithley Publishes Online Tutorial Seminars on CD
Cleveland, Ohio, 10 March 2011 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has assembled a collection of its most popular web tutorials and seminars in a convenient CD format. “Tips and Techniques for Today’s Challenging Electrical Measurements” is available free upon request at:

Free Keithley Webinar Teaches Fundamentals of Hall Effect Measurements
Cleveland, Ohio, February 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free webinar on "Hall Effect Measurement Fundamentals" onThursday, February 17, 2011.

Keithley University Offers Free Tutorial Webcasts
Cleveland, Ohio, February 15, 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announces “Keithley University,” a series of tutorial webcasts that cover best practices for making even the most demanding measurements. Access to Keithley University is available free at: http://www.keithley.com/promo/at/566.

Keithley Releases Four New “How-To” Videos on Operating Electrometers
Cleveland, Ohio, February 15, 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has produced a series of four new tutorial videos on topics related to configuring and operating one of its most sensitive measurement instruments.

Special Price Offer for World Class Test and Measurement Equipment from Keithley Instruments
20% discount on selected instruments until April 30, 2011 Cleveland, Ohio, February 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, is offering 20% off list price on a range of broad-purpose Test & Measurement instruments to its European customers. The offer is available for a limited period of time, starting with immediate effect and ending on April 30, 2011.

Keithley Instruments Enhances Throughput and Accuracy of S530 Parametric Test Systems
Cleveland, Ohio, January 20, 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today introduced several enhancements to its line of S530 Parametric Test Systems, the most cost-effective fully automatic production parametric test solutions available to the semiconductor industry.

Keithley Publishes 2011 Test & Measurement Product Catalog CD
Cleveland, Ohio, January 2011 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published its 2011 Test & Measurement Product Catalog in CD form.

KEITHLEY INSTRUMENTS’ SHAREHOLDERS APPROVE MERGER AGREEMENT
Cleveland, Ohio - November 19, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced that, at its special meeting of shareholders held today, the Company’s shareholders approved and adopted the Agreement and Plan of Merger, dated as of September 29, 2010, among Danaher Corporation, Aegean Acquisition Corporation and Keithley Instruments and the transactions contemplated thereby.

KEITHLEY INSTRUMENTS ACQUIRED BY DANAHER CORPORATION
Cleveland, Ohio - December 8, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced completion of the merger of Aegean Acquisition Corporation, an indirect wholly owned subsidiary of Danaher Corporation, into Keithley pursuant to the previously announced Merger Agreement dated September 29, 2010 among Danaher Corporation, Aegean Acquisition Corporation and Keithley.

Keithley Instruments Releases 11 New “How-To” Videos on Configuring and Operating Source-Measure Units
Cleveland, Ohio, December 7, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has produced a series of 11 new tutorial videos on topics related to configuring and operating one of their most popular product types, Source-Measure Units (SMUs). The videos, which range from one to four minutes in length, focus on the award-winning Series 2400 SourceMeter® instruments and can be downloaded and viewed at http://www.youtube.com/KeithleyInst.

Keithley Instruments Hosts Applications Forum to Encourage Idea Exchange, Discussions Among Users
Cleveland, Ohio, November 11, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, is host-ing a forum designed to offer customers and users of Keithley instrumentation a central location for finding product support and exchanging applications insights via the web.

Free Keithley Webinar Explains How to Overcome the Challenges of Electrical Resistivity Measurement
Cleveland, Ohio, November 8, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors" on Thursday, November 18, 2010 at 15:00 Central European Time (CET).

KEITHLEY INSTRUMENTS REPORTS FOURTH QUARTER FISCAL 2010 SALES GROWTH OF 58 PERCENT AND NET INCOME OF $9.1 MILLION
Cleveland, Ohio - November 4, 2010 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fourth quarter and year ended September 30, 2010.

Free Keithley Online Seminar Sheds Light on High Brightness LED Testing
Cleveland, Ohio, October 20, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Overcoming the Electrical Measurement Challenges of High Brightness LEDs” on Thursday, October 28, 2010 at 15:00 Central European Summer Time (CEST).

Nobel Prize Winners in Physics Used Keithley Instrumentation
Cleveland, Ohio, October 8, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, extends its congratulations to Drs.

Danaher to Acquire Keithley Instruments
Washington, D.C., and Solon, OH; September 29, 2010 - Danaher Corporation (NYSE:DHR) and Keithley Instruments, Inc.

Keithley ACS Basic Edition Version 1.2 Provides New Levels of Usability, Convenience, and Productivity for Semiconductor Test Applications
Cleveland, Ohio, September 28, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications.

Keithley Earns Metrology Reaccreditation, is Among the First Labs to Earn New U.S. Accreditation
Cleveland, Ohio, September 8, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation).

New Keithley Switch Mainframes Boost System Throughput for Semiconductor Test Applications
Cleveland, Ohio, September 1, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments. By providing significantly higher command-to-connect speeds, these switch mainframes make faster test sequences and greater overall system throughput possible.

Keithley Offers Free CD of Nanotechnology Test Tutorials
Cleveland, Ohio, July 13, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced its new Nanotechnology Technical Test Library on CD.

Are you registered? Keithley Spells Out Basics of Electrical Measurements in Free Online Seminar
Cleveland, Ohio, June 29, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Understanding the Basics of Electrical Measurements” on Thursday, July 8, 2010. To register for this event, visit http://www.keithley.info/basics10.

Keithley Introduces Low-Cost, Full-Featured USB-to-GPIB Interface Adapter
Cleveland, Ohio, June 24, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter.

Keithley Spells Out Basics of Electrical Measurements in Free Online Seminar
Cleveland, Ohio, June 22, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Understanding the Basics of Electrical Measurements” on Thursday, July 8, 2010.

Keithley's New Reed Relay Matrix Card Combines Ultra-High Density and Superior Configuration Flexibility
Cleveland, Ohio, May 13, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card.

Free Keithley Web-Based Seminar Explores New Measurement Techniques and Capabilities for Testing Flash Memory
Cleveland, Ohio, May 11, 2010 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “New Methods for Testing FLASH Memory” on Thurs-day, May 20, 2010.

Keithley Instruments Reports 25 Percent Sales Growth and Net Income of $4.1 Million for Second Quarter Fiscal 2010


Keithley Creates a Guide to Understanding Electrical Test and Measurement on CD
Cleveland, Ohio, April 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has released a tutorial CD that offers practical and helpful techniques for obtaining the most accurate and precise measurements possible.

Free technical Web Seminar from Keithley explores Fundamentals of Ultra-Fast I-V Device Characterization
Cleveland, Ohio, April 16, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Fundamentals of Ultra-Fast I-V Device Characterization” on Thursday, April 29, 2010.

New Keithley Online Tutorial Provides Information on Ultra-Fast I-V Measurement Applications
Cleveland, Ohio, March 24, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has created an interactive applications overview that provides instruction and insight into a variety of semiconductor measurement applications that require ultra-fast I-V measurements.

Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results
Cleveland, Ohio, March 18, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps of Semiconductor Ca-pacitance-Voltage (C-V) Testing” on Thursday, March 25, 2010.

Keithley Publishes Digital Multimeter Technical Library on CD
Cleveland, Ohio, March, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has published a digital multimeter (DMM) technical library for engineers and researchers who use DMMs for a wide range of applications.

Keithley Publishes 2010 Test & Measurement Product Catalog CD
Cleveland, Ohio, March 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published its 2010 Test & Measurement Product Catalog in CD form.

Keithley's Ultra-Fast Current-Voltage System Combines Three Essential Characterization Capabilities in One Chassis
Cleveland, Ohio, February 18, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System.

Free Keithley Online Seminar Explores Phase Change Memory Measurement Techniques
Cleveland, Ohio, 18 February 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Phase Change Memory: Fundamentals and Measurement Techniques” on Thursday, February 25, 2010.

LeCROY Chooses Keithley RF/Microwave Switch for its Superspeed USB 3.0 Test Suite
Cleveland, Ohio, February 3, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced today that LeCroy Corporation, a leading producer of serial data test solutions, has chosen Keithley’s System 46 (S46) RF/Microwave Switch System as part of the original equipment for its new USB 3.0 Test Suite product family.

Keithley Instruments Reports Profitable Results For Fiscal 2010 First Quarter
Cleveland, Ohio, February 1, 2010 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced re-sults for its fiscal 2010 first quarter ended December 31, 2009.

Free Keithley Web-Based Seminar Illustrates Best Practices for On-Wafer Probing
Cleveland, Ohio, 19 January 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps for On-Wafer Probing” on Thursday, January 28, 2010.

Keithley Instruments Restores Employee Compensation; Updates First Quarter Fiscal 2010 Guidance
Cleveland, Ohio, January 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced that it will restore employee compensation to full pay effective January 1, 2010.

Keithley Instruments Announces Sale of RF Product Line
Cleveland, Ohio, November 2009 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced that it has signed a definitive agreement with Agilent Technologies, Inc. (“Agilent”) to sell substantially all of its RF product line to Agilent.

Technical Web Seminar from Keithley Teaches the Basics of Low Current Electrical Measurements
Cleveland, Ohio, 11 November 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is hosting a free online seminar in which the company will explore the basics of electrical measurements from nA to fA.

Keithley Explores the Basics of Semiconductor C-V Testing in Free Online Seminar
Cleveland, Ohio, 26 October 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will host a free 45-minute online seminar entitled “Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals”.

Keithley Expands Range of DC Source-Measure Instruments Compatible with ACS Basic Edition Software
Cleveland, Ohio, August 27, 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation.

New Keithley Microsite Offers Access to Informative Photovoltaic Measurements Seminar, Online Solar Cell Demo
Cleveland, Ohio, July 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices.

New High Speed, Long Life 6×16 Matrix Card Expands Keithley’s Series 3700 System Switch/Multimeter Family
Cleveland, Ohio, July 6, 2009 - Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, today announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6×16 High Speed, Reed Relay, Matrix Card.

Keithley Adds Free Graphing Toolkit to Series 3700 System Switch/Multimeter Firmware for an “Early Look” at Acquired Data
Cleveland, Ohio, June 22, 2009

Free Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing
Cleveland, Ohio, May 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Semiconductor Capacitance-Voltage (C-V) Fundamentals,” which will be presented by Electronic Design magazine. Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). This one-hour seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. To register for this event, visit http://tiny.cc/Oj6Zm.

Free Keithley Web-Based Technical Seminar Explores Electrical Measurements of Photovoltaic/Solar Cell Devices
Cleveland, Ohio, May 11, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing.

Keithley Instruments Reports Results for Fiscal 2009 Second Quarter
Cleveland, Ohio, April 29, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 second quarter ended March 31, 2009.

Keithley Seminar to Visit Two Benelux Locations
Cleveland, Ohio, April 2, 2009 * * * Keithley Instruments, Inc.

Keithley Seminar Tour Takes Place in 22 European Cities
Cleveland, Ohio, April 1, 2009 * * * Keithley Instruments, Inc.

Keithley European Seminar Tour to Visit Two Swedish Locations in May
Cleveland, Ohio, April 2, 2009 * * * Keithley Instruments, Inc.

Keithley European Seminar Tour to Visit Four UK Locations in May
Cleveland, Ohio, April 1, 2009 * * * Keithley Instruments, Inc.

Keithley White Paper Describes Semiconductor Characterization and Parametric Test Challenges
Cleveland, Ohio, March 2009 * * * Keithley Instruments, Inc.

Only Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment now Available from Keithley
Cleveland, Ohio, March 20, 2009 * * * Keithley Instruments, Inc.

Keithley Upgrades Model 4200-SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support
Cleveland, Ohio, March 20, 2009 * * * Keithley Instruments, Inc.

Keithley Webcast Seminar Explores how to Avoid Parallel Test Implementation Pitfalls
Cleveland, Ohio, March 19, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Keithley Offers Attractive Price Specials for Test & Measurement Instruments
Cleveland, Ohio, March 16, 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, is offering a 20% discount off the list price on a range of world-class Test & Measurement instruments to its European customers. The offer is available for a limited period of time, starting with immediate effect and ending on May 31, 2009.

Keithley Instruments Reports Results for Fiscal 2009 First Quarter
Cleveland, Ohio, February 2009 * * * Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 first quarter ended December 31, 2008.

Free Keithley Web-Based Seminar Explores Fundamentals of Hall Effect Measurements
Cleveland, Ohio, February 12, 2009

Keithley Instruments Reports 22 Percent Sales Growth for Fiscal 2008 Third Quarter
Cleveland, Ohio, July 24 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 third quarter ended June 30, 2008.

Keithley and Azimuth Systems Announce Collaboration to Create LTE, WiMAX RF Testing Solutions
Cleveland, Ohio and Acton, Massachusetts, June 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a joint effort with Azimuth Systems, a leading provider of wireless broadband test equipment and channel emulators for WiMAX, 4G, and Wi-Fi (Acton, MA).

Fulks Receives 2008 IEEE Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement
Cleveland, Ohio, June 3, 2008 * * * The Institute of Electrical and Electronics Engineers (IEEE) has announced that Robert G. Fulks is the recipient of the 2008 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.

Keithley Creates Precision Sourcing and Measurement Resource Guide CD
Cleveland, Ohio, May 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of the Precision Sourcing and Measurement Resource Guide.

Keithley Releases CD of Semiconductor Device Test Applications
Cleveland, Ohio, May 8, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of the Semiconductor Device Test Applications Guide.

Keithley Releases New Edition of Switching Handbook
Cleveland, Ohio, Mai, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released the sixth edition of its Switching Handbook: A Guide to Signal Switching in Automated Test Systems.

Automated Characterization Suite (ACS) Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster
Cleveland, Ohio, April 29, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications.

Keithley Instruments Reports 21 Percent Sales Growth for Fiscal 2008 Second Quarter
Cleveland, Ohio, April 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 second quarter ended March 31, 2008.

Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
Cleveland, Ohio, February 11, 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a partnership with Stratosphere Solutions, Inc. (Sunnyvale, CA), a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers.

Keithley Instruments Reports Results for Fiscal 2008 First Quarter
Cleveland, Ohio, January 2008 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced results for its fiscal 2008 first quarter ended December 31, 2007.

Keithley ACS Version 3.2 Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput
Cleveland, Ohio, January 10, 2008 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of ACS (Automated Characterization Suite) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level.

Keithley makes C-V/I-V/Pulse Testing Faster, Simpler, and More Economical with New Integrated C-V Module and Software in Market-Leading 4200-SCS
Cleveland, Ohio, SEMICON Europa, Stuttgart, October 9, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a new C-V measurement instrument for its powerful Model 4200-SCS Semiconductor Characterization System.

Keithley’s German Service Center Joins List of ISO 17025 Accredited Laboratories
Cleveland, Ohio, Germering, Germany, October 1, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that the American Association for Laboratory Accreditation (A2LA) has accredited Keithley’s German service center to ISO/IEC 17025:2005, the single most important metrology standard for test and measurement products.

Keithley and CNSI Announce Nanotechnology Measurement Partnership
Cleveland, Ohio, September 20, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced a new partnership with The California NanoSystems Institute at UCLA.

Keithley Adds Low Current Capability to SourceMeter® Line for Fast, Compact, and Economical Parametric Testing
Cleveland, Ohio, September 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces two new additions to its Series 2600 SourceMeter® Instruments to create the industry’s most advanced and cost effective solution for semiconductor parametric analysis and testing.

New Keithley System Switch Platform Offers High Throughput Signal Switching, LXI Class B, and Optional High-Performance Integrated DMM
Cleveland, Ohio, September 13, 2007 * * * Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of the Series 3700 System Switch/Multimeter and Plug-in Card Family, Keithley’s next-generation platform of switching and integrated digital multimeter (DMM) test solutions.

Keithley Introduces Linux-Based Parametric Test Systems
Cleveland, Ohio, July 19, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces a group of enhancements for its S600 Series Parametric Test Systems.

Keithley Announces Advanced Parametric Probe Card Availability
Cleveland, Ohio, July 18, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has qualified FormFactor, Inc., (Nasdaq:FORM), Livermore, California, to manufacture high performance parametric test probe cards for Keithley’s semiconductor parametric testers.

Keithley Announces Joint Development Partnership with France’s CEA Leti Laboratory to Pursue Advanced Nanotechnology and Semiconductor Materials Research
Cleveland, Ohio , Grenoble, France, July 17, 2007 *** Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has entered into a Joint Development Partnership (JDP) surrounding semiconductor device material testing technology with CEA Leti, one of the world’s most sophisticated semiconductor development laboratories.

Keithley Instruments Recognized for Excellence by Texas Instruments
Cleveland, Ohio - July 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced that it has received the Texas Instruments (TI) 2006 Supplier Excellence Award.

Keithley Instruments Expects Financial Results for its Second Quarter of Fiscal 2007 to be Below Guidance
Cleveland, Ohio - April 2007 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced that sales levels for the second quarter of fiscal 2007, which ended March 31, 2007, fell short of the guidance range that was previously provided.

Keithley Publishes Handbook on Nanotechnology Measurement
Cleveland, Ohio - April 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its Nanotechnology Measurement Handbook, a 124-page guide to electrical measurements for nanoscience applications.

Keithley Launches Integrated Test Systems for Faster and Easier Semiconductor Testing
Cleveland, Ohio - April 12, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level.

Keithley Introduces New Enhanced Pulse and Pulse I-V Capabilities for Advanced Semiconductor Device Testing
Cleveland, Ohio - March 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the newest release of hardware and software advances for its award-winning Model 4200-SCS Semiconductor Characterization System, representing the next step in pulse test offerings for the Model 4200-SCS.

Keithley Introduces Handbook for Parametric Parallel Test
Cleveland, Ohio - February 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook.

Keithley Recognized for Outstanding Customer Satisfaction in Semiconductor Industry
Cleveland, Ohio - January 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has been recognized for outstanding customer satisfaction by VLSI Research Inc, a global leader in providing independent customer evaluations of semiconductor equipment suppliers.

Keithley’s New Parametric Test Software Upgrade Enhances Parallel Test, RF Test, and Ease
Cleveland, Ohio - December 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of KTE V5.2, Keithley’s Interactive Test Environment software for the Series S600 Parametric Test System.

Keithley Introduces New Low-Cost, Full Featured GPIB Interface
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board.

Keithley Introduces New Version of Test Software for Improved Pulse Measurements
Cleveland, Ohio - November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the release of KTE Interactive V6.1, an updated version of its powerful KTEI (Keithley Test Environment Interactive) measurement software for its Model 4200-SCS Semiconductor Characterization System.

Keithley and Mesatronic Enter Agreement to Advance Parametric Wafer Probe Technology For Economical, High Performance, Ultra Low Current and RF Probe Cards
Cleveland, Ohio – November 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces it has partnered with Mesatronic Group (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications.

Keithley's Metrology Services Earns Rigorous ISO 17025 Accreditation
Cleveland, Ohio - September 2006 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, announces that its Metrology Services Group is now accredited to ISO/IEC 17025:2005,the single most important metrology standard for test and measurement, by the A2LA (American Association for Laboratory Accreditation).

Keithley Publishes 2006 Test And Measurement Product Catalog
Cleveland, Ohio – January 5, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its 2006 Test and Measurement Product Catalog.

Keithley Instruments Reports Results for Fiscal 2005 Fourth Quarter and Year
Cleveland, Ohio - November 4, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fourth quarter and year that ended September 30, 2005.

Keithley Opens New Offices in Asia to Optimize Local Applications and Customer Support
Cleveland, Ohio - October 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced significant expansions of its business presence in southeast Asia with an office expansion in Singapore and the opening of two new offices in Malaysia.

Keithley Publishes New Semiconductor Test Tutorial Handbook
Cleveland, Ohio, - July 2005 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, has published a semiconductor test reference handbook titled Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF-From Modeling to Manufacturing.

Keithley Introduces New Semiconductor Reliability Test System For 65NM And Beyond
Cleveland, Ohio - April 11, 2005 - Keithley Instruments, Inc. (NYSE:KEI), announces the S510 Semiconductor Reliability Test System, a high channel count, turnkey solution for use in reliability testing and lifetime modeling of the world’s most advanced ULSI CMOS processes at the 65nm node and beyond.

Keithley Introduces Family of USB Data Acquisition Solutions
Cleveland, Ohio – March 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Series KUSB-3100 USB-based data acquisition (DAQ) measurement solutions.

Hynix Awards Keithley Repeat Multi-Million Dollar Order for S680DC/RF Semiconductor Test System for Production Testing of 300mm Wafers
Cleveland, OH - March 14, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, today announced it has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Hynix Semiconductor, Inc., a leading Korean semiconductor manufacturer and one of the world's largest DRAM (Dynamic Random Access Memory) producers.

Keithley Introduces 3RD Generation of On-Wafer RF Measurement Capability
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces its third generation on-wafer RF measurement capability for semiconductor parametric production process control.

Keithley Introduces Industry's Fastest, Smallest, and Most Cost-Effective Source-Measure Units for Multi-Channel Applications
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Series 2600 System SourceMeter® Instruments, a new platform that significantly lowers the cost of test for a wide range of electronic component producers, including silicon and compound semiconductor manufacturers.

Keithley's Model S680 Semiconductor Test System Selected by AMD Fab 36 in Dresden, Germany
Cleveland, Ohio, February 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced that AMD (NYSE: AMD) has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany.

Keithley Instruments Reports 20% Sales Growth and 156% Earnings Growth for Fiscal 2005 First Quarter
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc.(NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2005 first quarter that ended December 31, 2004.

Keithley Expands Switching Product Line, Offering Industry's Highest Density Half-Rack Switching System
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 7002-HD high-density two-slot switching mainframe and cards, offering instrument grade switching at a price up to 40% less than comparable platforms.

Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices
Cleveland, Ohio, January 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released an interactive, tutorial CD on reliability testing for semiconductor test engineers.

Keithley Low Level Measurements Handbook Contains Tutorial Information on How to Make Accurate, Sensitive Measurements
Cleveland, Ohio, October 2004 Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, has published an updated version of its popular reference book titled, "Low Level Measurements Handbook: Precision DC Current, Voltage, and Resistance Measurements."

Keithley Releases USB-to-GPIB Interface Adapter
Cleveland, Ohio, October 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KUSB-488 USB-to-GPIB Interface Adapter. The Model KUSB-488 transforms any computer with a USB port into a full-function, IEEE 488.2 controller that can control up to 14 programmable GPIB instruments.

Keithley Instruments Receives Order for Multiple S680 Parametric Test Systems from Leading Korean Fab
Cleveland, Ohio, September 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced it has received a multi-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF Parametric Test Systems. The multi-million dollar order represents tools for production process control of both 200mm and 300mm wafers.

Keithley Reports Double-Digit Sales and Order Growth for Fiscal 2004 Third Quarter
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, a leader in solutions for emerging measurement needs, announced results for its fiscal 2004 third quarter that ended June 30, 2004.

Keithley Introduces Ready-to-Run 200mm Wafer Test System for 130nm Node and Beyond
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has developed a packaged, ready-to-run parametric test system with unrivaled cost-per-pin and total price/performance ratio.

Keithley Launches Model 2182A Nanovoltmeter for Eliminating Noise in Low Voltage Measurements
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced its Model 2182A nanovoltmeter, which is optimized for making low noise measurements in research, metrology, nanotechnology, superconductivity, and other low voltage/resistance applications.

Keithley Releases Precision DC AND AC/DC Current Sources
Cleveland, Ohio, July 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, introduced its Model 6221 AC and DC Current Source and Model 6220 DC Current Source.

Keithley provides free Test & Measurement Seminar CD
Cleveland, Ohio, March 25, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today announced that it is releasing a tutorial CD containing a collection of its on-line seminars on measurement methods.

Keithley Instruments Announces Nanotech Partnership with The SUNY-Albany Nanotech Center
Albany, NY, February 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that it is partnering with the Albany NanoTech Center at the University at Albany - State University of New York (SUNY) to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies.

New System Tests 300mm Wafers in 200mm Test Times
Cleveland, Ohio, January 2004 - Keithley Instruments, Inc. (NYSE: KEI) today announced the newest model in its S600 Series family, the S680DC/RF Parametric Test System.