Keithley Introduces Measurement How-To Library on CD

The technical seminars in the Simplified Test Toolkit CD are informative and easy-to-understand and cover topics such as:

• Software-Defined Radio Architecture and Next-Generation RF Instrumentation
• Meeting New Challenges in Wafer Level Reliability Testing
• Making Successful Electrical Measurements on Nanoscale Materials and Devices
• Advances in Testing: The Advantages of On-Board Test Sequencing

The Simplified Test Toolkit CD also includes technical presentations on Keithley's powerful test and measurement systems, including the Series 2600 SourceMeter® Instruments, the Model 4200-SCS Semiconductor Characterization System with Pulse I-V capabilities, Series 3400 Pulse/Pattern Generators, and the Models 2810 RF Vector Signal Analyzer and 2910 RF Vector Signal Generator. Users can also request individualized configuration assistance from Keithley's application engineers, as well as a quote on any of Keithley's test and measurement products or systems.

For information on any of Keithley's test and measurement systems or to request a copy of the Simplified Test Toolkit visit http://www.keithley.com/pr/068 or contact the company at http://www.keithley.com

About Keithley

With 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Its products solve emerging measurement needs in production testing, process monitoring, product development, and research. The company’s customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device and wafer characterization, and the production of end products such as electronic assemblies or portable wireless devices. The value Keithley provides its customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.