Home / news / Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results

Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results

Document Actions
Cleveland, Ohio, March 18, 2010 * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps of Semiconductor Ca-pacitance-Voltage (C-V) Testing” on Thursday, March 25, 2010.


Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results


Cleveland, Ohio, March 18, 2010  * * * Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing” on Thursday, March 25, 2010. This one-hour seminar will discuss the keys to getting good C-V measurement results and will help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V. To register for this event, visit http://www.keithley.info/cvtesting10.

Those participating in Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will have the opportunity to learn:

  • How to properly connect a C-V instrument to a probe station
  • Common cable correction techniques
  • Performance verification at the probe tips
  • How to identify and troubleshoot typical C-V errors
  • How to implement extended C-V applications, such as high voltage and quasistatic C-V

This seminar is intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.


About the Presenter.

Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will be presented by Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland, Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.


Registration Information.

Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will be broadcast on Thursday, March 25, 2010 at 15:00 CET (2 p.m. GMT) for the European audience.  The event is free to the public, but participants must register in advance at http://www.keithley.info/cvtesting10. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.
For more information on Keithley or any of its test solutions contact the company at: www.keithley.com.


About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.


* * *
Products and company names listed are trademarks or trade names of their respective companies.







page updated: 2010-03-23