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- Manual
- 6514 Japanese Quick Result Guide
- Model 6514 System Electrometer Instruction Manual
- Model 6514 System Electrometer Quick Results Guide
- Model 8607 Safety High-Voltage Dual Test Leads
- Model 5156 Electrometer Calibration Standard Release Notes
- Data Sheet
- Model 6514 Programmable Electrometer
- High Impedance Semiconductor Resistivity and Hall Effect Test Configurations
- Hall Effect Measurements Overview
- 2013 Bench Products Test and Measurement Solutions
- Specification
- Model 6514 Electrometer Specifications
- FAQ
- Why does the 6514 in remote DDC mode operation return only five and a half digit readings?
- Why does my 6514 read OHMs correctly in unguared mode but reports open CKT in guarded mode?
- What are the significant differences between the Models 6514 and 6517A Electrometers?
- How do I connect my electrometer/voltage source to make a high resistance measurement on my device?
- Why do physical movements of cables create hundreds of picoamps of current?
- If you have a bent coax cable, but it is not being moved, can it still generate current?
- What are 'counts' in the accuracy specification?
- Why does my picoammeter (or electrometer) give a non-zero reading when I short the input?
- Why do I measure an offset current from an unbiased photomultiplier tube (PMT)?
- What is the purpose of zero check?
- How do I calculate the input resistance of a feedback picoammeter?
- How do I measure the offset current of my picoammeter or electrometer?
- What is a Guard?
- How will the voltage burden affect my current measurements?
- What is the voltage burden specification of an electrometer or picoammeter?
- ExceLINX: Why does ExceLINX periodically freeze up if Excel's AutoSave add-in is enabled?
- ExceLINX: Why Isn't ExceLINX Available from all User Profies?
- ExceLINX: Why does ExceLINX or my IVI Driver Installation Hang at the 'Copying VISA Runtime' Dialog?
- What is the difference between guarding and shielding?
- What is the purpose of guarding?
- What is the guard terminal of an electrometer or an SMU?
- Remote Operation: What VISA Resource Name is required when using the KPCMCIA-GPIB card (Ines)?
- Why are my electrometer measurements noisy?
- How do I shield my high impedance device from electrostatic fields?
- Remote Operation: Front panel push buttons do not work when operating in DDC mode?
- Remote Operation: If using math functions, can I also get the raw data?
- What are the differences between an electrometer, pico-ammeter and current amplifier?
- Specs: How does an Electrometer differ from a Digital MultiMeter (DMM) ?
- Specs: How Can I Apply an Accuracy Specification on a Data Sheet to my Specific Measurement?
- Remote Operation: What do I need to communicate with an instrument from a PC?
- Speed: What would be a good instrument to use to measure di/dt?
- Specs: What is CMRR (Common Mode Rejection Ratio)?
- Troubleshooting: How do I limit ground loops?
- Specs: What are the effects on accuracy due to possible deterioration within calibration periods?
- Speed: What is NPLC?
- ExceLINX: What are the differences in the various ExceLINX products?
- Selector Guide
- Low Current/ High Resistance Measurement Selector Guide
- Application Note
- #2615 Determining Resisitivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source
- Low Current Measurements
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- Article
- Problem: Errors in Low Current Measurements
- Problem: Noise in Low Current Measurements
- Problem: Error in Low Voltage, Low Current Measurements
- Brochure
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- High Accuracy Electrometers for Low Current/High Resistance Applications
- Solutions for Educational Labs and University-Based Researchers
- Your Guide to Creating High Performance Switching Applications
- E-Handbook Guide to Switch Considerations by Signal Type
- White Paper
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
Model 6517B Electrometer/High Resistance Meter
- Manual
- Model 6517B-ILC-3 Interlock Cable
- Model 6517B Electrometer Reference Manual
- Model 6517B Electrometer User's Manual
- Model 8607 Safety High-Voltage Dual Test Leads
- Models 8501-1 and 8501-2 Trigger Link Cables
- Specification
- Model 6517B Specifications
- Data Sheet
- Model 6517B Electrometer/High Resistance Meter
- 2013 Bench Products Test and Measurement Solutions
- Selector Guide and Data Sheet for Cables
- FAQ
- Does the 6517A Electrometer automatically compensate for temperature and humidity?
- Can you explain the usage of the Guard terminal on a DMM?
- How to Configure the Ohms Function of the 6517A Electrometer
- Which settings are important for the 6517A to communicate on RS-232?
- What does OUT OF LIMIT message on the display of 6517A mean?
- Should I use special probes to measure picoamp level currents?
- What are the significant differences between the Models 6514 and 6517A Electrometers?
- Why Do I get 'No GPIB Board' Error Message from 6524 Software when using the KPCMCIA-GPIB Interface?
- How do I connect my electrometer/voltage source to make a high resistance measurement on my device?
- Why do physical movements of cables create hundreds of picoamps of current?
- If you have a bent coax cable, but it is not being moved, can it still generate current?
- What are 'counts' in the accuracy specification?
- Why does my picoammeter (or electrometer) give a non-zero reading when I short the input?
- Why do I measure an offset current from an unbiased photomultiplier tube (PMT)?
- What is the purpose of zero check?
- How do I calculate the input resistance of a feedback picoammeter?
- How do I measure the offset current of my picoammeter or electrometer?
- What is a Guard?
- How will the voltage burden affect my current measurements?
- What is the voltage burden specification of an electrometer or picoammeter?
- What is the difference between guarding and shielding?
- What is the purpose of guarding?
- What is the guard terminal of an electrometer or an SMU?
- Why are my electrometer measurements noisy?
- How do I shield my high impedance device from electrostatic fields?
- Remote Operation: Front panel push buttons do not work when operating in DDC mode?
- Remote Operation: If using math functions, can I also get the raw data?
- What are the differences between an electrometer, pico-ammeter and current amplifier?
- Specs: How does an Electrometer differ from a Digital MultiMeter (DMM) ?
- Specs: How Can I Apply an Accuracy Specification on a Data Sheet to my Specific Measurement?
- Remote Operation: What do I need to communicate with an instrument from a PC?
- Speed: What would be a good instrument to use to measure di/dt?
- Specs: What is CMRR (Common Mode Rejection Ratio)?
- Troubleshooting: How do I limit ground loops?
- Specs: What are the effects on accuracy due to possible deterioration within calibration periods?
- Speed: What is NPLC?
- Application Note
- #315 Capacitor Leakage Measurements Using a Model 6517A Electrometer
- #314 Volume and Surface Resistivity Application Note
- Making High Resistance Measurements on Small Crystals in Inert Gas or High Vacuum w/ the Model 6517A
- #1138 Switching in Multipoint Testing
- 2218 Production Testing of High-Intensity Visible LEDs
- #312 High Resistance Measurements Application Note
- Quick Reference Guide to SCPI Commands
- #2402 DC Production Testing of OLED Displays
- Eliminating Common SCPI Errors
- Low Current Measurements
- Guide to Measuring New Materials and Devices
- #2208 Solutions for Production Testing of Connectors
- White Paper
- Improving the Repeatability of Ultra-High Resistance and Resistivity Measurements
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
- Article
- The Right Tools for the Right Measurement
- Common Challenges in Voltage Switching
- Problem: Errors in Low Current Measurements
- Problem: Measurements are Low in High Resistance Measurements
- Problem: Noisy Readings in High Resistance Measurements
- Problem: Noise in Low Current Measurements
- Problem: Error in Low Voltage, Low Current Measurements
- Selector Guide
- Low Current/ High Resistance Measurement Selector Guide
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- Guide to Measuring New Materials and Devices
- Advances in Electrical Measurements for Nanotechnology
- Brochure
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- High Accuracy Electrometers for Low Current/High Resistance Applications
- Solutions for Educational Labs and University-Based Researchers
- New Materials and Devices E-Guide
- Advances in Electrical Measurements for Nanotechnology E-Handbook
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
- Your Guide to Creating High Performance Switching Applications
- E-Handbook Guide to Switch Considerations by Signal Type
Model 6521 Low-Current, 10-Ch Scanner Card (for Model 6517A)
- Specification
- Model 6521 Low Current Scanner Specifications Rev. A
- Data Sheet
- Models 6521 and 6522 Low Current, 10-Channel Scanner Cards for 6517B
- Manual
- Model 6521 Low Current and Model 6522 Voltage/Current Scanner Cards Instruction Manual Rev. B
- Models 6521 and 6522 Scanner Cards Firmware Compatibility Notice
- Brochure
- High Accuracy Electrometers for Low Current/High Resistance Applications
Model 6522 Low-Current, High-Impedance Voltage, High-Resistance, 10-Ch Scanner Card (for Model 6517A)
- Specification
- Model 6522 Low Current/Voltage Scanner Specifications Rev. A
- Data Sheet
- Models 6521 and 6522 Low Current, 10-Channel Scanner Cards for 6517B
- Manual
- Model 6521 Low Current and Model 6522 Voltage/Current Scanner Cards Instruction Manual Rev. B
- Models 6521 and 6522 Scanner Cards Firmware Compatibility Notice
- Article
- Common Challenges in Voltage Switching
- Brochure
- High Accuracy Electrometers for Low Current/High Resistance Applications
- Your Guide to Creating High Performance Switching Applications
- E-Handbook Guide to Switch Considerations by Signal Type
- Data Sheet
- Model 428-PROG Programmable Current Amplifier
- Manual
- Model 428 Current Amplifier Quick Reference Guide Rev. A
- Model 428 Current Amplifier Instruction Manual Rev. D (7.1MB)
- FAQ
- What is the maximum current that can be measured using the Model 428 Current Amplifier?
- Amps: What is the best instrument for measuring currents at high amperage rates?
- How small of a current can an electrometer or a picoammeter measure?
- What are the differences between an electrometer, pico-ammeter and current amplifier?
- Speed: What would be a good instrument to use to measure di/dt?
- Specification
- Model 428 Current Amplifier Specifications Rev. B
- Brochure
- High Accuracy Picoammeters For Low Current/High Resistance Applications
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- High Accuracy Electrometers for Low Current/High Resistance Applications
- Application Note
- How fast can I make measurements with a Picoammeter?
- Low Current Measurements
- Selector Guide
- Low Current/ High Resistance Measurement Selector Guide
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- White Paper
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
Model 6485 5-1/2 digit Picoammeter with 10fA Resolution
- Specification
- Model 6485 Picoammeter Specifications Rev. B
- Manual
- Model 6485 Instruction Manual
- Models 6485 & 6487 Chinese User's Manual
- Models 6485 / 6487 Japanese User's Manual (1.7MB) Rev. A
- Model 6485 & Model 6487 User's Manual
- Model 5156 Electrometer Calibration Standard Release Notes
- FAQ
- How can Zero Check be enabled/disabled using IVI drivers with LabVIEW (LV) for 6485
- Why do physical movements of cables create hundreds of picoamps of current?
- If you have a bent coax cable, but it is not being moved, can it still generate current?
- How small of a current can an electrometer or a picoammeter measure?
- Why does my picoammeter (or electrometer) give a non-zero reading when I short the input?
- Why do I measure an offset current from an unbiased photomultiplier tube (PMT)?
- What is the purpose of zero check?
- How do I calculate the input resistance of a feedback picoammeter?
- How do I measure the offset current of my picoammeter or electrometer?
- How will the voltage burden affect my current measurements?
- What is the voltage burden specification of an electrometer or picoammeter?
- ExceLINX: Why does ExceLINX periodically freeze up if Excel's AutoSave add-in is enabled?
- ExceLINX: Why Isn't ExceLINX Available from all User Profies?
- ExceLINX: Why does ExceLINX or my IVI Driver Installation Hang at the 'Copying VISA Runtime' Dialog?
- Remote Operation: What VISA Resource Name is required when using the KPCMCIA-GPIB card (Ines)?
- Why are my electrometer measurements noisy?
- How do I shield my high impedance device from electrostatic fields?
- Remote Operation: Front panel push buttons do not work when operating in DDC mode?
- What are the differences between an electrometer, pico-ammeter and current amplifier?
- Specs: How does an Electrometer differ from a Digital MultiMeter (DMM) ?
- Specs: How Can I Apply an Accuracy Specification on a Data Sheet to my Specific Measurement?
- Remote Operation: What do I need to communicate with an instrument from a PC?
- Speed: What would be a good instrument to use to measure di/dt?
- Specs: What is CMRR (Common Mode Rejection Ratio)?
- Troubleshooting: How do I limit ground loops?
- Specs: What are the effects on accuracy due to possible deterioration within calibration periods?
- Speed: What is NPLC?
- ExceLINX: What are the differences in the various ExceLINX products?
- Data Sheet
- Model 6485 Picoammeter
- 2013 Bench Products Test and Measurement Solutions
- Article
- Problem: Noisy Readings in High Resistance Measurements
- Hall Effect Measurements Essential for Characterizing High Carrier Mobility
- Problem: Errors in Low Current Measurements
- Problem: Noise in Low Current Measurements
- Problem: Error in Low Voltage, Low Current Measurements
- White Paper
- Hall Effect Measurements in Materials Characterization
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
- Selector Guide
- Low Current/ High Resistance Measurement Selector Guide
- Optoelectronics Test Selector Guide
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- Guide to Measuring New Materials and Devices
- Advances in Electrical Measurements for Nanotechnology
- Application Note
- #312 High Resistance Measurements Application Note
- How fast can I make measurements with a Picoammeter?
- Low Current Measurements
- Guide to Measuring New Materials and Devices
- Brochure
- High Accuracy Picoammeters For Low Current/High Resistance Applications
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- High Accuracy Electrometers for Low Current/High Resistance Applications
- Solutions for Educational Labs and University-Based Researchers
- New Materials and Devices E-Guide
- Advances in Electrical Measurements for Nanotechnology E-Handbook
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Model 6487 Picoammeter/Voltage Source
- Data Sheet
- Model 6487 Picoammeter/Voltage Source
- 2013 Bench Products Test and Measurement Solutions
- FAQ
- Why do I get a 'CLOSE INTLCK' error when trying to turn ON the source of my 6487?
- What is the Input Resistance of the 6487 when Zero Check is enabled?
- Why do physical movements of cables create hundreds of picoamps of current?
- If you have a bent coax cable, but it is not being moved, can it still generate current?
- How small of a current can an electrometer or a picoammeter measure?
- Why does my picoammeter (or electrometer) give a non-zero reading when I short the input?
- Why do I measure an offset current from an unbiased photomultiplier tube (PMT)?
- ExceLINX: Why does ExceLINX periodically freeze up if Excel's AutoSave add-in is enabled?
- ExceLINX: Why Isn't ExceLINX Available from all User Profies?
- ExceLINX: Why does ExceLINX or my IVI Driver Installation Hang at the 'Copying VISA Runtime' Dialog?
- Remote Operation: What VISA Resource Name is required when using the KPCMCIA-GPIB card (Ines)?
- Remote Operation: Front panel push buttons do not work when operating in DDC mode?
- What are the differences between an electrometer, pico-ammeter and current amplifier?
- Specs: How does an Electrometer differ from a Digital MultiMeter (DMM) ?
- Specs: How Can I Apply an Accuracy Specification on a Data Sheet to my Specific Measurement?
- Remote Operation: What do I need to communicate with an instrument from a PC?
- Speed: What is NPLC?
- ExceLINX: What are the differences in the various ExceLINX products?
- Manual
- Model 6487 Picoammeter/Voltage Source Release Notes Rev. A
- Model 6487 Picoammeter/Voltage Source Manual Reference Manual
- Models 6485 & 6487 Chinese User's Manual
- Models 6485 / 6487 Japanese User's Manual (1.7MB) Rev. A
- Model 6485 & Model 6487 User's Manual
- Model 5156 Electrometer Calibration Standard Release Notes
- Specification
- Model 6487 Picoammeter Specifications Rev. A
- Article
- Problem: Noisy Readings in High Resistance Measurements
- Problem: Errors in Low Current Measurements
- Problem: Measurements are Low in High Resistance Measurements
- Problem: Noisy Readings in High Resistance Measurements
- Problem: Noise in Low Current Measurements
- Problem: Error in Low Voltage, Low Current Measurements
- Selector Guide
- Low Current/ High Resistance Measurement Selector Guide
- Optoelectronics Test Selector Guide
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- Guide to Measuring New Materials and Devices
- Advances in Electrical Measurements for Nanotechnology
- Application Note
- #312 High Resistance Measurements Application Note
- How fast can I make measurements with a Picoammeter?
- Low Current Measurements
- Guide to Measuring New Materials and Devices
- Brochure
- High Accuracy Picoammeters For Low Current/High Resistance Applications
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- Solutions for Educational Labs and University-Based Researchers
- New Materials and Devices E-Guide
- Advances in Electrical Measurements for Nanotechnology E-Handbook
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
- White Paper
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
Model 6220 DC Precision Current Source
- Specification
- Models 6220 Current Source Specifications Rev. B
- Manual
- Model 6220 DC Current Source Model 6221 AC and DC Current Source Reference Manual
- Model 6220 DC Current Source Model 6221 AC and DC Current Source User's Manual
- Data Sheet
- High Impedance Semiconductor Resistivity and Hall Effect Test Configurations
- Model 6220 DC Current Source and Model 6221 AC and DC Current Source
- 2013 Bench Products Test and Measurement Solutions
- Article
- Hall Effect Measurements Essential for Characterizing High Carrier Mobility
- AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
- Characterizing Nanoscale Devices with Differential Conductive Measurements
- Low-Voltage Measurement Techniques
- Troubleshooting Low Voltage Measurement Problems
- Problem: Errors in Low Resistance Measurements
- Problem: Noisy Readings in Low Resistance Measurements
- Problem: Reading Drift in Low Resistance Measurements
- White Paper
- New Instruments Can Lock Out Lock-ins
- An Improved Method for Differential Conductance Measurements
- Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications
- Hall Effect Measurements in Materials Characterization
- Accurate Low-Resistance Measurements Start with Identifying Sources of Error
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
- Brochure
- Precision, Low Current Sources for Device Testing and Characterization
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- Making Precision Low Voltage and Low Resistance Measurements E-Handbook
- New Materials and Devices E-Guide
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
- Application Note
- #2615 Determining Resisitivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source
- Guide to Measuring New Materials and Devices
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- Guide to Measuring New Materials and Devices
- Selector Guide
- Low Voltage/ Low Resistance Measurements
- Optoelectronics Test Selector Guide
Model 6221 AC and DC Current Source
- Specification
- Model 6221 AC and DC Current Source Specifications Rev. B
- Manual
- Model 6220 DC Current Source Model 6221 AC and DC Current Source Reference Manual
- Model 6220 DC Current Source Model 6221 AC and DC Current Source User's Manual
- Network Connection Tutorial for Ethernet Based Instruments
- Article
- New dG Measurement Methods Reveal Nanodevice Characteristics Faster, at Lower Cost
- Unraveling Fuel Cell Electrical Measurements
- AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
- Characterizing Nanoscale Devices with Differential Conductive Measurements
- Low-Voltage Measurement Techniques
- Electrical Measurements on Nanoscale Materials
- Troubleshooting Low Voltage Measurement Problems
- The Emerging Challenges of Nanotechnology Testing
- Pulse Testing for Nanoscale Devices
- Application Note
- #2611 Low-Level Pulsed Electrical Characterization with the Model 6221/2182A Combination
- #2615 Determining Resisitivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source
- Guide to Measuring New Materials and Devices
- White Paper
- New Instruments Can Lock Out Lock-ins
- An Improved Method for Differential Conductance Measurements
- Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications
- Hall Effect Measurements in Materials Characterization
- Optimizing Low-Current Measurements and Instruments (also Applicable to Series 2600B)
- Brochure
- Precision, Low Current Sources for Device Testing and Characterization
- E-Handbook: Making Precision Low Current and High Resistance Measurements
- Making Precision Low Voltage and Low Resistance Measurements E-Handbook
- Keithley Pulse Solutions
- New Materials and Devices E-Guide
- Advances in Electrical Measurements for Nanotechnology E-Handbook
- Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
- Data Sheet
- Model 6220 DC Current Source and Model 6221 AC and DC Current Source
- 2013 Bench Products Test and Measurement Solutions
- Handbook
- Making Precision Low Current and High Resistance Measurements - E-Handbook
- Guide to Measuring New Materials and Devices
- Advances in Electrical Measurements for Nanotechnology
- Selector Guide
- Function/Pulse/Arbitrary Pattern Generators Selector Guide
- Low Voltage/ Low Resistance Measurements
- Optoelectronics Test Selector Guide