Our ACS-based (Automated Characterization Suite) Integrated Test Systems is configurable for applications as varied as component test, component characterization, device characterization, parametric test, and reliability test. Built with high integrity Keithley hardware (including Series 2600A and Series 2400 SourceMeter Instruments, the Model 4200-SCS Semiconductor Characterization System, Series 700 Switch Systems, and Series 3700 System Switch/Multimeters) ACS systems are ideal for those who need the throughput of a semi- or fully automatic wafer probe station to get lots of data fast. Its wafer prober automation option makes it easy to interface popular probe stations into the test setup.