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Semiconductor Reliability Test Solutions
ACS for WLR
Automated Characterization Suite (ACS) Test Systems
  • Interactive interface
  • Flexible test sequencing
  • Powerful stress/measure tool
  • Formulator for parameter analysis and line fits
  • Easy point-and-click analysis
S500 SMU-per-Pin System
Automated Characterization Suite (ACS) Test Systems
  • True SMU-per-pin parallel testing
  • Precision timing and synchronization
  • Configurable from 2 to 44 SMUs in a single rack
  • Manual and automated operation
  • Add hardware, test plans, and libraries as needed
  • Compatible with popular fully automatic probers
4200-SCS Semiconductor Parameter Analyzer
Automated Characterization Suite (ACS) Test Systems
  • Stress/measure looping control
  • Compliant with many JEDEC standard test methods
  • Extensive pre/post stress/measure test libraries
  • Formulator for parameter analysis and line fits
  • Spreadsheet with analysis tools
  • Full-featured plotting tool
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CALL NUMBER
1-800-935-5595 (US Only)